Advantest offers solutions for a wide variety of semiconductors and test needs, from SoC and memory, to R&D evaluation and system level test.

The ADVANTEST T5377 is a multi-functional test system designed for memory semiconductors, aimed at reducing testing costs for semiconductor manufacturers. It serves both front-end testing of DRAM semiconductors and back-end testing of flash memory semiconductors. With the capability to test up to 256 devices simultaneously, the T5377 significantly improves testing efficiency. The T5377 offers double the throughput capabilities of its predecessor, the T5371, resulting in higher production rates and decreased testing costs for customers. It optimizes its memory repair analytical structure to align with a user's memory repair algorithm, making it well-suited for semiconductor manufacturing facilities that utilize 300-millimeter wafers.

ADVANTEST

T5377

The ADVANTEST T2000 is a highly versatile test platform with a module architecture, allowing flexible reconfiguration for different applications. It offers a wide range of functional modules, including digital, high-performance analog, power-mixed signals, and image capture, enabling comprehensive test coverage at an optimal cost. The T2000's scalability spans from a 9-slot air cooling system to a 52-slot liquid cooling system with up to 8,192 channels. Advantest offers compact solutions for reduced initial investment in development and small lot productions, as well as high-efficiency multiple-DUT parallel measurement solutions for mass productions. The T2000 quickly adapts to market needs with minimal capital investment, making it a preferred choice in the semiconductor industry.

T2000

T5371

T5585

M6541AD

The M6300 delivers a throughput of up to 12,000 units-per- hour (UPH). Its thermal-control function supports tests within a temperature range of -30 degrees C to +125 degrees C, with an option to extend the lower range to -55 degrees C.

M6300

M6771AD

The ADVANTEST T5375 is a multi-functional test system designed for memory semiconductors, offering cost-saving benefits for semiconductor manufacturers. It is utilized for both front-end testing of DRAM semiconductors and back-end testing of flash memory semiconductors. With the ability to test up to 256 devices simultaneously, the T5375 provides efficient and high-throughput testing. The T5375 is specifically focused on capturing an increased market share in front-end DRAM semiconductor testing

T5375

The ADVANTEST T5588, or T5588 System on Chip (SoC) Tester, is a state-of-the-art semiconductor testing equipment from Advantest Corporation. This advanced system is tailored to conduct thorough testing and verification of integrated circuits (ICs) and SoCs throughout the manufacturing process. With its cutting-edge capabilities, the T5588 ensures high precision and efficiency in semiconductor testing, making it a valuable tool for semiconductor manufacturers seeking top-level performance and reliability.

T5588

The ADVANTEST T5593 is a specialized test system designed for memory semiconductors, specifically targeting high-speed SRAM, DDR-SRAM, DDR2-SDRAM, DDR3-SDRAM, SGRAM, and DRAM markets. SRAM, which stands for static random access memory, is a type of semiconductor memory that does not require refreshing while powered on, unlike DRAM. SGRAM, or synchronous graphics random access memory, is used for graphics applications. The T5593 is optimized for designing and manufacturing super high-speed memory devices. It offers the capability to simultaneously test up to 256 DDR2-SDRAM devices, providing efficient and reliable testing for these memory types. 

 T5593

Advantest‘s new T5592 Memory Test System for use in the mass production of Direct Rambus DRAM (D-RDRAM). The T5592 is capable of testing up to 64 devices in parallel and has a testing speed of 1.066 GHz.

T5592

D3186 is a high-performance pulse pattern generator to generate 7 types of pseudo-random (PRBS) patterns from 2(7)-1 to 2(31) -1, programmable (WORD) patterns up to SM 2(23) bits, or frame patterns of SDH or SONET structure at very high speed from 150 Mb/s to 12 Gb/s. Moreover, a system, which is used to evaluate the bit error rate of super-high speed optical communication devices and compound semiconductors, can be structured by combining D3186 with the D3286 error detector.

D3186

The ADVANTEST T2000 LS is a highly versatile test platform with a modular architecture, allowing flexible reconfiguration based on the application's requirements. It offers a diverse range of functional modules, including digital, high-performance analog, power-mixed signals, and image capture, ensuring extensive test coverage at an optimal cost. The T2000 LS can be scaled from a 9-slot air cooling system to a 52-slot liquid cooling system with up to 8,192 channels, catering to various testing needs in the semiconductor industry.

T2000 LS

M6542AD

T5581H

The ADVANTEST T5377S is a versatile memory test system capable of efficiently and cost-effectively testing a wide range of memory types. This system can handle both traditional and high-speed memory interfaces, making it suitable for various memory testing requirements. With its advanced features and capabilities, the T5377S ensures reliable and accurate testing, optimizing the testing process for memory devices while keeping costs under control.

T5377S

The T2000 EPP system enables module splitting, in which one module can test multiple devices concurrently. Each device under test (DUT) can be monitored and assessed independently.

T2000 EPP

The ADVANTEST M6741A is an exceptional memory device handler known for its top-notch performance and speed. It is considered one of the best and fastest handlers available on the used market. With its advanced capabilities, the M6741A efficiently handles memory devices, making it a highly sought-after solution for various applications.

M6741A

T5335P

The ADVANTEST T6372 is a test system specifically developed for non-memory semiconductors used in high-definition LCD displays. It enables simultaneous testing of multiple semiconductors for LCD driver integrated circuits, accommodating a total of up to 1,536 pins. 

T6372

T6535

The top-of-the-line device in the T5500 series is the T5501, a memory semiconductor test system most suitable for testing and production of ultra high-speed memory semiconductor such as the next generation SGRAM. This model allows twice as much spectrum band to be covered in terms of testing speed as the T5593 and thus enhances the measurement accuracy.

T5501

D3286

The ADVANTEST T5503HS is an advanced semiconductor testing system developed by Advantest Corporation. This system is specifically designed to offer comprehensive testing and verification of high-speed digital and mixed-signal semiconductor devices throughout the manufacturing process. Its sophisticated capabilities ensure precise and reliable testing, making it an essential tool for semiconductor manufacturers seeking top-level performance and quality assurance.

T5503HS

M6751AD

MPT3000ENV

T5832

B6700DES incorporates all capabilities of B6700D into a smaller configuration for engineering purpose. It contributes to a reduced TAT (turn around time) from R&D to device production.

B6700DES

T3347A

A pick-and-place hander that handles eight DUTS in parallel for a total throughput of up to 8,000 devices per hour.
The M4871 handler features a variety of capabilities for improving test yields and reducing cycle times. An advanced visual-alignment function enables positioning accuracy of below 0.3 mm ball/pad pitch for handling fine-pitch semiconductors and devices with both top- and bottom-side contacts. This precise alignment capability also helps to speed up set-up and calibration times for greater test-cell productivity.

M4871

T5365P

T5771

T 5771ES

B6700S system offers a dramatically lower-cost test solution for NAND flash memories while offering the same capabilities as its sister systems. The B6700S offers a unitized function of the B6700D and can be embedded within a multi-wafer probing system used in individual wafer-level testing, avoiding any costs associated with occupying floor space in lab or production environments.

B6700S

T5372

M6741AD

T6672

The T6673 is designed to reduce total test costs associated with the production of SoC semiconductors. The T6673 is designed to test SiC semiconductors incorporated into high-speed communication network equipment and wireless handsets, digital consumer products and other electronic systems. The T6673 can test semiconductor chips with a maximum pin count 1,024, thus matching the trend of SoC semiconductors with increasing pin counts. The T6673 is capable of both front- and back-end testing of SoC semiconductors.

T6673

HIFIX

T6371

T5335

T5581P

TR6846

The ADVANTEST T2000 IPS (Integrated Power Device Test Solution) is an advanced testing system specifically designed for automotive and power management applications. With its high-performance and high-throughput capabilities, the T2000 IPS efficiently tests various devices used in these industries. This comprehensive solution offers a wide range of feature-rich capabilities, ensuring precise and reliable testing of automotive and power management components. Moreover, the T2000 IPS plays a crucial role in reducing test costs by increasing throughput without compromising on the quality of testing results.

T2000 IPS

T5334

The T6577 test systems for SoC semiconductors in the T6500 series are primarily designed to test MCU and SoC semiconductors that control digital consumer products at the production lines. The T6500 series is approximately one-third in size, and uses approximately 50% less power, as compared to Advantest's predecessor product line. Further, the T6500 series operates on a software that is compatible with T6600 series.

T6577

The M6242 and M6243 test handlers for test systems for memory semiconductors, including DDR3-SDRAM, can handle up to 512 semiconductors at a time. Their maximum throughput is 42,200 semiconductors per hour through the use of a new high-speed handling technology that shortens the time between tests to approximately half of the time associated with Advantest’s ordinary model. In addition, the M6242 and M6243 have a built-in temperature control device which can minimize the temperature fluctuation within a 1.5°C range for temperatures between -10°C and 100°C. 

M6243

The T5383, which is capable of simultaneously testing up to 384 devices and has the same footprint as the T5377S with the capacity to test up to 50% more devices at one time, is a test system with a maximum testing rate is 286 MHz/572 Mbps, which is twice the testing rate for Advantest's previous model.

T5383

The M6751A Dynamic Test Handler processes 4500 devices per hour through design breakthroughs that concentrate high-speed handling technologies. The M6751A Dynamic Test Handler processes 4500 devices per hour through design breakthroughs that concentrate high-speed handling technologies. Aimed at the memory device market, including TSOP, SOJ, QFP, BGA, and CSP set-ups, the device provides an advanced memory production system.

M6751A

M7211A

M6721A

T5336

Q8384

The M4872 features Advantest's Active Thermal Control function, which controls the test temperature with high accuracy even when testing high-end processors and other high-heat-generating devices. Additionally, it inherits the configuration of the M4871, with 10 automatic stockers that enable highly precise device sorting, while delivering a 10% reduction in footprint.

M4872

T8571A	

T5365

Multi Vision Metrology Scanning Electron Microscope
In addition to its high-functionality CD-SEM features, the E3630 makes 3D imaging and measurement at the nanometer level, in real time and in a non-destructive way, possible. The E3630 significantly contributes to reducing TAT in R&D and production for many processes that require high-precision and/or 3D analysis.

E3630

T6575

B6700L has the same resources as the B6700D while accommodating a wider temperature range. The ability to perform temperature-controlled testing from -40° C to +150° C in one-tenth of a degree increments makes this system well suited for reliability and automotive-device testing. The B6700L also can simultaneously test up to 12 B6700D-compatible burn-in boards (BIB) and test programs.

B6700L

T5382

The T5586 Memory Test System enables high throughput testing of DDR SDRAMs.

T5586

The ADVANTEST T5833 is a cost-efficient, high-volume test solution capable of conducting wafer sort and final test for DRAM and NAND flash memory devices. With the increasing demand for faster and higher-capacity memory devices in mobile electronics, smart phones, tablets, internet, and cloud servers, chipmakers face challenges in testing a wide array of memory devices while maintaining high functionality and performance at a low cost of test (COT). The T5833 addresses these needs by offering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories, and next-generation non-volatile memory ICs.

T5833

T5781 Engineering Station (T5781ES), which is designed for evaluation of devices and development of test programs in a developmental / laboratory environment. 

T5781ES

T5376

The ADVANTEST T6373 is an advanced test system featuring a high-speed and precision digitizer along with a DC (LCD ch) test unit configured for per-pin operation. This tester is specifically designed for testing many-pin and precision (10 bit/1024 gradation) driver ICs. Compared to its predecessor, the T6373 achieves an impressive throughput increase of up to 150%. 

T6373

T6372L

Advantest’s new T2000 AiR offers broad test coverage for these diverse modules and system-in- package (SiP) devices.  With its modular architecture providing maximum flexibility, the tester can be configured with up to six discrete air-cooled measurement modules. This enables single-system test coverage for a wide array of highly integrated, multi-functional devices. Designed to perform digital functions and SCAN testing over as many as 512 channels in parallel, the system can test high-voltage devices up to 2,000 volts, high-precision DC converters, automotive DC devices, mixed-signal ICs with bandwidths up to 100 MHz, RF communication chips and CMOS image sensors.

T2000 AiR

As the SSD market continues to grow, device manufacturers need a low-cost way to test their expanding product portfolios. The MPT3000HVM and MPT3000HVM2 testers provide broad capabilities to handle virtually any SSD, from the highest performing enterprise drives to the most cost-effective client devices. This unmatched functionality presents a major advantage in the rapidly changing SSD market.

MPT3000HVM

This close cooperation between engineers from Japan and the U.S. is to thank for the success of the Japan and U.S. tester development teams in making it possible for Advantest to ship the T5831ES system designed for next-generation NAND flash memory R&D applications in April 2013, as initially planned.

T5831ES

B6700D uses a high-capacity power supply that delivers a maximum of 256 amps per burn-in board - twice that of the first-generation B6700 tester. In addition, it has twice the driver pin resources as its predecessor, enabling it to reach higher testing frequencies and efficiency. It can also maintain or increase parallelism to keep throughput high as the number of stacked NAND die per package increases in the future. Additionally, the B6700D's oven can replicate operating conditions while controlling temperature in 0.1 ℃ increments.

B6700D

T6573

ADVANTEST’s T5385 memory test system for DRAM wafer test delivers an unrivaled 768-DUT parallel test capacity and 533 Mbps capability for increased throughput and lowered cost of test.  Ideal for high-volume wafer fabs, the new tester is equipped with a flexible pin configuration that supports diverse DRAM devices, allowing tester pin resources to be optimally allocated for efficiency, reduced touchdowns and improved throughput. Achieving improved efficiency per device while scaling even higher in parallelism, the T5385 also delivers Known Good Die (KGD) for consumer devices, to greatly improve yields for LPDDR2 and DDR3 multi-die and stacked devices.

T5385

The M6541A Dynamic Test Handler is designed with a proprietary four-step handling function that keeps index time to a minimum, the M6541A can handle simultaneous testing of up to 64 devices — 6,000 devices per hour. The M6541A's touch panel and comprehensive help function make it extremely easy to operate. In addition, the system was designed so that the time needed for establishing operating requirements and correcting problems are significantly reduced.

M6541A

T5571P

Synchronized 2-Channel Generation, Measurement 
Measurement Resolution of 1 µV, 10 fA (SMU220-2), 100 pA (SMU62-20)
Source Range ±220 V, ±2 A (SMU220-2, 2.4 W)/±62 V, ±20 A (SMU62-20, 140 W)
Minimum Pulse Width 100 µs, Minimum Step 700 µs

R6245

Q7606BF

The T8571 is a test system for non memory semiconductors that is primarily used to evaluate and analyze CCDs that are image sensors. These semiconductors are used in digital consumer products, such as high-resolution digital cameras, mobile phone handset cameras and digital video cameras.

T8571

Advantest’s T5773 is a package test system for NAND flash memory that supports high-speed interfaces for SSDs, handsets and other applications, meeting the test needs of new device types that demand as much as 4X the test speed of previous generations. The T5773’s operating frequency range is 200MHz / 400Mbps and offers a typical parallel test capacity of 768 DUTs. Additionally, the T5773’s innovative design achieves significant power and floorspace savings, helping to lower customer test costs dramatically. Advantest also offers a compatible T5773ES, an engineering system for R&D use.

T5773

U3772 is a portable 31 GHz resps. 43 GHz spectrum analyzer that can be used in microwave production lines, in installation and maintenance of links and satellite transmission, and for a variety of other purposes.

U3772

M 7211

R3768	

R3765CG

T6565A

T3324

The MPT3000HES and MPT3000HES2 systems offer the same modular hardware, operating software, thermal performance and interfaces as other members of its product family. What distinguishes this tester is a smaller yet highly efficient configuration. The MPT3000HES's and MPT3000HES2's compact size and tester-per-DUT performance make it ideally suited for applications such as low-volume testing and "copy exactly" engineering support for the MPT3000HVM and MPT3000HVM2 production test systems.

MPT3000HES

R7210

Advanced automobiles are required to have improved environmental and safety performance, and are also expected to be connected to the IoT through connected car and autonomous car technology.
The HA7200 enables these improvements by providing high-speed, high-accuracy temperature and pressure test for automotive sensor R&D and production. Advantest's proprietary temperature control technology delivers an optimized test solution for high-spec pressure sensors across a broad range of temperatures, in the automotive industry and beyond. Combined with a test handler and Advantest's EVA100 measurement system, the HA7200 anchors a sensor test cell system that provides an easy-to-use test environment covering all stages of product development, from design evaluation to mass production.

HA7200

Defect Review SEM supports next-generation photomasks
The E5610 is a MASK DR-SEM(Defect Review - Scanning Electron Microscope) for reviewing and classifying ultra-small defects in photomask and blanks.
Utilizing Advantest's highly stable, full automatic image capture technology, the E5610 easily imports defect location data from mask inspection systems and automatically images the locations. In addition, it features a newly developed EDS(Energy Dispersive X-ray Spectrometry) module that performs elemental analysis. With its high-accuracy, high-throughput defect review capability, the E5610 is expected to contribute to next-generation photomask production quality improvement and shorter manufacturing TAT.

E5610

T5723ES

The R3760 network analyzer, low in cost and with a space-saving design, measures and evaluates the frequency characteristics of receiving/transmitting antennas and filters, which are used for wireless communications such as mobile phones, WiMAX, WiFi, and ETC systems for ubiquitous communication.



R3760

T5833ES

T3334

The TAS5500 performs absolute power measurement in the terahertz band to a high standard of accuracy, utilizing a large-diameter calorimeter. Based on the Japanese national standard for infrared measurement of 10.6μm, which Advantest has expanded to the terahertz region, the TAS5500 delivers measurement accuracy of ±11%.

TAS5500

Resolution for faulty area detection: 5μm (Time domain: 0 to 800 ps, accumulated 16384 times), 10μm (Time domain: 800 to 1500 ps, accumulated 16384 times)

TS9001

The T7721 and T7722 are test systems for non memory semiconductors for mixed signal integrated circuits. The T7721 targets highly complex semiconductors used in car electronics and results from the development of Advantest's constituent technology that measures analog signals. The T7721 uses a direct current signal generator with a range of 150V to  64V and utilized up to a maximum of 256 pins, and the T7721 has the capacity to simultaneously measure multiple devices.

T7721

WAFER MVM-SEM E3310 - Multi Vision Metrology SEM supports next-generation wafers.
The E3310 is a WAFER MVM-SEM for next generation wafers, supporting 1Xnm node process development and volume production at the 22nm node and beyond. With its high-speed carrier system employing a dual arm vacuum robot, and low-vibration platform to improve measurement accuracy, the E3310 delivers high throughput and performance for wafer measurements. Its multi detector configuration and unique 3D measurement algorithm also enable stable, high-accuracy measurement of 3D transistor technologies such as FinFET. The E3310 makes a significant contribution to reducing process development turnaround time and improves productivity for next-generation devices.

E3310

The ATS 5034 SLT (System-Level Test Platform) delivers a level of sophisticated testing that automates system level testing on a massive scale, making it easy and affordable to conduct 100% SLT. Test up to 396 DUTs simultaneously to achieve a throughput volume of up to 5,000 units per hour (UPH). Combine this throughput with a small factory floor footprint and achieve the industry's lowest cost of system-level test.

ATS 5034

The E3650 using Advantest's proprietary electron beam scanning technology, the new tool measures fine pattern dimensions on photomasks with higher precision and stability.The E3650 is the newest entry in the company's E3600 series, which has been widely accepted in the photomask SEM market. It enables measurement throughput to be doubled compared with the existing model, the E3640. E3650's higher throughput enables massive measurement required by more complex patterning and increased number of masks due to multiple patterning. In addition to leading-edge photomasks, the new tool also demonstrates superior performance when measuring EUV masks and master templates for nanoimprint applications.

E3650

M7521A is a test handler that can be used for chip on film, or COF, and tape automated bonding, or TAB of integrated circuit drivers used in flat-panel displays. The M7521A can test devices used in 34 millimeter, 48 millimeter, 70 millimeter, wide and superwide tapes.

ADVANTEST

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T5377

T2000

T5371

T5585

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