설명
설명 없음환경 설정
Part Number: 97152822 • Revision: REV 3 • Description: High-density pogo pin interface board featuring multiple vertical daughter cards (blades). • Architecture: Modular slot-based design. The assembly contains approximately 20 signal/power cards designed for high-parallelism testing. • Applications: Mixed-signal testing, power management ICs (PMIC), and consumer microcontrollers.OEM 모델 설명
Sapphire is our next generation high performance SoC configurable test platform. First shipped by NPTest in December 2003, it is designed to be a highly reconfigurable and scalable functional and structural tester for a wide range of ICs. All of Sapphire’s test electronics are integrated in the test head and interconnected by a proprietary high bandwidth bus, which results in a lower cost platform and a smaller footprint. Sapphire can be used for design debug and validation, characterization, wafer sort and final test. The design supports a broad configuration range of up to 5,000 pins and a performance envelope that ranges from 200 MHz to 6.4 GHz.문서
문서 없음
카테고리
Final Test
마지막 검증일: 8일 전
주요 품목 세부 정보
조건:
Used
작동 상태:
Deinstalled
제품 ID:
144985
웨이퍼 사이즈:
알 수 없음
Config / Diag File:
No
빈티지:
알 수 없음
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
유사 등재물
모두 보기
COHU / LTX-CREDENCE
SAPPHIRE
카테고리
Final Test
마지막 검증일: 8일 전
주요 품목 세부 정보
조건:
Used
작동 상태:
Deinstalled
제품 ID:
144985
웨이퍼 사이즈:
알 수 없음
Config / Diag File:
No
빈티지:
알 수 없음
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
설명 없음환경 설정
Part Number: 97152822 • Revision: REV 3 • Description: High-density pogo pin interface board featuring multiple vertical daughter cards (blades). • Architecture: Modular slot-based design. The assembly contains approximately 20 signal/power cards designed for high-parallelism testing. • Applications: Mixed-signal testing, power management ICs (PMIC), and consumer microcontrollers.OEM 모델 설명
Sapphire is our next generation high performance SoC configurable test platform. First shipped by NPTest in December 2003, it is designed to be a highly reconfigurable and scalable functional and structural tester for a wide range of ICs. All of Sapphire’s test electronics are integrated in the test head and interconnected by a proprietary high bandwidth bus, which results in a lower cost platform and a smaller footprint. Sapphire can be used for design debug and validation, characterization, wafer sort and final test. The design supports a broad configuration range of up to 5,000 pins and a performance envelope that ranges from 200 MHz to 6.4 GHz.문서
문서 없음