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설명
설명 없음환경 설정
CREDENCE SAPPHIRE TESTER - Configuration: // Configuring Credence_TestHeadIf in slot[0] // Configuring NPTest_6AmpDPS in slot[1] // Configuring NPTest_6AmpDPS in slot[2] // Configuring NPTest_6AmpDPS in slot[37] // Configuring NPTest_D4064PS in slot[6] // Configuring NPTest_D4064PS in slot[7] // Configuring NPTest_D4064PS in slot[31] // Configuring NPTest_QBIX in slot[16] // Configuring NPTest_QBIX in slot[23] + calibration kit Credence SAPPHIRE Spare Instruments: 12 Cartes D4064 (64 channels digitaux 400MBs) P/N 9615-2147 1 Carte QBIX (Analog cards 4 channels) P/N 9615-2007 2 Cartes D3208 (8 channels digitaux 3.2 Gbs) P/N 9615-2158 4 Cartes DPS (Power Supply) P/N 9615-2005 1 Carte THIF (Test Head interface) P/N 9615-2014 18 Module 48V P/N 122_1257-00 6 Module 24V P/N 001-4062-0007OEM 모델 설명
Sapphire is our next generation high performance SoC configurable test platform. First shipped by NPTest in December 2003, it is designed to be a highly reconfigurable and scalable functional and structural tester for a wide range of ICs. All of Sapphire’s test electronics are integrated in the test head and interconnected by a proprietary high bandwidth bus, which results in a lower cost platform and a smaller footprint. Sapphire can be used for design debug and validation, characterization, wafer sort and final test. The design supports a broad configuration range of up to 5,000 pins and a performance envelope that ranges from 200 MHz to 6.4 GHz.문서
문서 없음
카테고리
Final Test
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
73441
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
유사 등재물
모두 보기
COHU / LTX-CREDENCE
SAPPHIRE
카테고리
Final Test
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
73441
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
설명 없음환경 설정
CREDENCE SAPPHIRE TESTER - Configuration: // Configuring Credence_TestHeadIf in slot[0] // Configuring NPTest_6AmpDPS in slot[1] // Configuring NPTest_6AmpDPS in slot[2] // Configuring NPTest_6AmpDPS in slot[37] // Configuring NPTest_D4064PS in slot[6] // Configuring NPTest_D4064PS in slot[7] // Configuring NPTest_D4064PS in slot[31] // Configuring NPTest_QBIX in slot[16] // Configuring NPTest_QBIX in slot[23] + calibration kit Credence SAPPHIRE Spare Instruments: 12 Cartes D4064 (64 channels digitaux 400MBs) P/N 9615-2147 1 Carte QBIX (Analog cards 4 channels) P/N 9615-2007 2 Cartes D3208 (8 channels digitaux 3.2 Gbs) P/N 9615-2158 4 Cartes DPS (Power Supply) P/N 9615-2005 1 Carte THIF (Test Head interface) P/N 9615-2014 18 Module 48V P/N 122_1257-00 6 Module 24V P/N 001-4062-0007OEM 모델 설명
Sapphire is our next generation high performance SoC configurable test platform. First shipped by NPTest in December 2003, it is designed to be a highly reconfigurable and scalable functional and structural tester for a wide range of ICs. All of Sapphire’s test electronics are integrated in the test head and interconnected by a proprietary high bandwidth bus, which results in a lower cost platform and a smaller footprint. Sapphire can be used for design debug and validation, characterization, wafer sort and final test. The design supports a broad configuration range of up to 5,000 pins and a performance envelope that ranges from 200 MHz to 6.4 GHz.문서
문서 없음