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COHU / LTX-CREDENCE SAPPHIRE
    설명
    설명 없음
    환경 설정
    CREDENCE SAPPHIRE TESTER - Configuration: // Configuring Credence_TestHeadIf in slot[0] // Configuring NPTest_6AmpDPS in slot[1] // Configuring NPTest_6AmpDPS in slot[2] // Configuring NPTest_6AmpDPS in slot[37] // Configuring NPTest_D4064PS in slot[6] // Configuring NPTest_D4064PS in slot[7] // Configuring NPTest_D4064PS in slot[31] // Configuring NPTest_QBIX in slot[16] // Configuring NPTest_QBIX in slot[23] + calibration kit Credence SAPPHIRE Spare Instruments: 12 Cartes D4064 (64 channels digitaux 400MBs) P/N 9615-2147 1 Carte QBIX (Analog cards 4 channels) P/N 9615-2007 2 Cartes D3208 (8 channels digitaux 3.2 Gbs) P/N 9615-2158 4 Cartes DPS (Power Supply) P/N 9615-2005 1 Carte THIF (Test Head interface) P/N 9615-2014 18 Module 48V P/N 122_1257-00 6 Module 24V P/N 001-4062-0007
    OEM 모델 설명
    Sapphire is our next generation high performance SoC configurable test platform. First shipped by NPTest in December 2003, it is designed to be a highly reconfigurable and scalable functional and structural tester for a wide range of ICs. All of Sapphire’s test electronics are integrated in the test head and interconnected by a proprietary high bandwidth bus, which results in a lower cost platform and a smaller footprint. Sapphire can be used for design debug and validation, characterization, wafer sort and final test. The design supports a broad configuration range of up to 5,000 pins and a performance envelope that ranges from 200 MHz to 6.4 GHz.
    문서

    문서 없음

    COHU / LTX-CREDENCE

    SAPPHIRE

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    검증됨

    카테고리
    Final Test

    마지막 검증일: 60일 이상 전

    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    73441


    웨이퍼 사이즈:

    알 수 없음


    빈티지:

    알 수 없음


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    유사 등재물
    모두 보기
    COHU / LTX-CREDENCE SAPPHIRE

    COHU / LTX-CREDENCE

    SAPPHIRE

    Final Test
    빈티지: 2007조건: 중고
    마지막 검증일60일 이상 전

    COHU / LTX-CREDENCE

    SAPPHIRE

    verified-listing-icon
    검증됨
    카테고리
    Final Test
    마지막 검증일: 60일 이상 전
    listing-photo-31db9ed847a447199f4a3909f3e7196c-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/51800/31db9ed847a447199f4a3909f3e7196c/39d2f74c94d440e0ad2cf4d82b4382a1_b866ce7888f24c9d9348a8a7e002779d1201a_mw.jpeg
    listing-photo-31db9ed847a447199f4a3909f3e7196c-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/51800/31db9ed847a447199f4a3909f3e7196c/48602d33b4e64d43bd9e8b91766014f5_34f16195ebf146e5aa2c14530bc249c81201a_mw.jpeg
    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    73441


    웨이퍼 사이즈:

    알 수 없음


    빈티지:

    알 수 없음


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    설명
    설명 없음
    환경 설정
    CREDENCE SAPPHIRE TESTER - Configuration: // Configuring Credence_TestHeadIf in slot[0] // Configuring NPTest_6AmpDPS in slot[1] // Configuring NPTest_6AmpDPS in slot[2] // Configuring NPTest_6AmpDPS in slot[37] // Configuring NPTest_D4064PS in slot[6] // Configuring NPTest_D4064PS in slot[7] // Configuring NPTest_D4064PS in slot[31] // Configuring NPTest_QBIX in slot[16] // Configuring NPTest_QBIX in slot[23] + calibration kit Credence SAPPHIRE Spare Instruments: 12 Cartes D4064 (64 channels digitaux 400MBs) P/N 9615-2147 1 Carte QBIX (Analog cards 4 channels) P/N 9615-2007 2 Cartes D3208 (8 channels digitaux 3.2 Gbs) P/N 9615-2158 4 Cartes DPS (Power Supply) P/N 9615-2005 1 Carte THIF (Test Head interface) P/N 9615-2014 18 Module 48V P/N 122_1257-00 6 Module 24V P/N 001-4062-0007
    OEM 모델 설명
    Sapphire is our next generation high performance SoC configurable test platform. First shipped by NPTest in December 2003, it is designed to be a highly reconfigurable and scalable functional and structural tester for a wide range of ICs. All of Sapphire’s test electronics are integrated in the test head and interconnected by a proprietary high bandwidth bus, which results in a lower cost platform and a smaller footprint. Sapphire can be used for design debug and validation, characterization, wafer sort and final test. The design supports a broad configuration range of up to 5,000 pins and a performance envelope that ranges from 200 MHz to 6.4 GHz.
    문서

    문서 없음

    유사 등재물
    모두 보기
    COHU / LTX-CREDENCE SAPPHIRE

    COHU / LTX-CREDENCE

    SAPPHIRE

    Final Test빈티지: 2007조건: 중고마지막 검증일:60일 이상 전
    COHU / LTX-CREDENCE SAPPHIRE

    COHU / LTX-CREDENCE

    SAPPHIRE

    Final Test빈티지: 0조건: 중고마지막 검증일:60일 이상 전
    COHU / LTX-CREDENCE SAPPHIRE

    COHU / LTX-CREDENCE

    SAPPHIRE

    Final Test빈티지: 0조건: 중고마지막 검증일:30일 이상 전