설명
Includes full passing diagnostics on final inspection.환경 설정
Teradyne UFlex-SC with: (3) UP1600 (4) HexVS+ (1) HDVS Tera 1 Ultra DPS2 License: 200mbps x 12 UP1600, 512MLVM x 12 UP1600, 256 Pattern memory, Scan license.OEM 모델 설명
UltraFLEX-SC is an optimized test system designed for testing high-performance digital and system-on-a-chip (SoC) devices. It provides the functionality and accuracy required to test complex SoC devices designed for mobile applications, networking, storage, and high-end use. With its 24 slot test system, UltraFLEX-SC is the perfect choice for devices that require high throughput, high-speed signals, precision signals, wide test coverage, and highly parallel test.문서
문서 없음
TERADYNE
UFLEX-SC
검증됨
카테고리
Final Test
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
77340
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
TERADYNE
UFLEX-SC
카테고리
Final Test
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
77340
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
Includes full passing diagnostics on final inspection.환경 설정
Teradyne UFlex-SC with: (3) UP1600 (4) HexVS+ (1) HDVS Tera 1 Ultra DPS2 License: 200mbps x 12 UP1600, 512MLVM x 12 UP1600, 256 Pattern memory, Scan license.OEM 모델 설명
UltraFLEX-SC is an optimized test system designed for testing high-performance digital and system-on-a-chip (SoC) devices. It provides the functionality and accuracy required to test complex SoC devices designed for mobile applications, networking, storage, and high-end use. With its 24 slot test system, UltraFLEX-SC is the perfect choice for devices that require high throughput, high-speed signals, precision signals, wide test coverage, and highly parallel test.문서
문서 없음