설명
설명 없음환경 설정
(1) Teradyne UltraFLEX-SC 24 Slot Test System (1) Integrated Manipulator (12) Slots Enabled (1) UltraDSP2 Computer (1) TERA1 Workstation (3) UltraPin1600+ 256 Pin Digital Card (6) HSD 128 Pin Enable License (6) HSD 128 pin 400Mbps License (6) HSD 128 pin 64/128/256M PATN DEPTH License (6) HSD 128 pin SCAN License (1) UP1600 PA N-WIRE System Wide License (4) HexVS (1) UltraVS256+ High Accuracy (1) RTU License & License Transfer FeeOEM 모델 설명
UltraFLEX-SC is an optimized test system designed for testing high-performance digital and system-on-a-chip (SoC) devices. It provides the functionality and accuracy required to test complex SoC devices designed for mobile applications, networking, storage, and high-end use. With its 24 slot test system, UltraFLEX-SC is the perfect choice for devices that require high throughput, high-speed signals, precision signals, wide test coverage, and highly parallel test.문서
문서 없음
TERADYNE
UFLEX-SC
검증됨
카테고리
Final Test
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
76129
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
TERADYNE
UFLEX-SC
카테고리
Final Test
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
76129
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
설명 없음환경 설정
(1) Teradyne UltraFLEX-SC 24 Slot Test System (1) Integrated Manipulator (12) Slots Enabled (1) UltraDSP2 Computer (1) TERA1 Workstation (3) UltraPin1600+ 256 Pin Digital Card (6) HSD 128 Pin Enable License (6) HSD 128 pin 400Mbps License (6) HSD 128 pin 64/128/256M PATN DEPTH License (6) HSD 128 pin SCAN License (1) UP1600 PA N-WIRE System Wide License (4) HexVS (1) UltraVS256+ High Accuracy (1) RTU License & License Transfer FeeOEM 모델 설명
UltraFLEX-SC is an optimized test system designed for testing high-performance digital and system-on-a-chip (SoC) devices. It provides the functionality and accuracy required to test complex SoC devices designed for mobile applications, networking, storage, and high-end use. With its 24 slot test system, UltraFLEX-SC is the perfect choice for devices that require high throughput, high-speed signals, precision signals, wide test coverage, and highly parallel test.문서
문서 없음