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SSM 5200
    설명
    Automatic CV System for CV/QV/IV measurement
    환경 설정
    환경 설정 없음
    OEM 모델 설명
    The SSM 5200 is an off-line metrology system that measures a variety of electrical oxide and dielectric characteristics on monitor wafers. It can measure capacitive effective thickness and equivalent oxide thickness of advanced gate dielectrics less than 1 nanometer thick with high precision. It also includes a wide range of current voltage (IV) measurements such as leakage current, TDDB, and SILC. The SSM 5200 uses a small elastic probe to form a temporary gate on the dielectric surface and an integrated pattern recognition system to locate scribe line test areas. The elastic probe has a diameter of less than 30 µm and does not damage the dielectric surface.
    문서

    문서 없음

    SSM

    5200

    verified-listing-icon

    검증됨

    카테고리
    Metrology

    마지막 검증일: 30일 이상 전

    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    115106


    웨이퍼 사이즈:

    8"/200mm


    빈티지:

    1997


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    유사 등재물
    모두 보기
    SSM 5200

    SSM

    5200

    Metrology
    빈티지: 1997조건: 중고
    마지막 검증일60일 이상 전

    SSM

    5200

    verified-listing-icon
    검증됨
    카테고리
    Metrology
    마지막 검증일: 30일 이상 전
    listing-photo-53c4fe85bf2d4c878760945f9fd103c9-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/53c4fe85bf2d4c878760945f9fd103c9/54cf81f64b904a789cb2c20815f57373_1a_mw.png
    listing-photo-53c4fe85bf2d4c878760945f9fd103c9-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/53c4fe85bf2d4c878760945f9fd103c9/957e957f2ffa46f5b36146f22b0b4c97_2a_mw.png
    listing-photo-53c4fe85bf2d4c878760945f9fd103c9-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/53c4fe85bf2d4c878760945f9fd103c9/0de57d9c06974b2aae2001909a4b4901_1c_mw.png
    listing-photo-53c4fe85bf2d4c878760945f9fd103c9-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/53c4fe85bf2d4c878760945f9fd103c9/124fda7fa3c4437d9838a8e8616cc10c_1b_mw.png
    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    115106


    웨이퍼 사이즈:

    8"/200mm


    빈티지:

    1997


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    설명
    Automatic CV System for CV/QV/IV measurement
    환경 설정
    환경 설정 없음
    OEM 모델 설명
    The SSM 5200 is an off-line metrology system that measures a variety of electrical oxide and dielectric characteristics on monitor wafers. It can measure capacitive effective thickness and equivalent oxide thickness of advanced gate dielectrics less than 1 nanometer thick with high precision. It also includes a wide range of current voltage (IV) measurements such as leakage current, TDDB, and SILC. The SSM 5200 uses a small elastic probe to form a temporary gate on the dielectric surface and an integrated pattern recognition system to locate scribe line test areas. The elastic probe has a diameter of less than 30 µm and does not damage the dielectric surface.
    문서

    문서 없음

    유사 등재물
    모두 보기
    SSM 5200

    SSM

    5200

    Metrology빈티지: 1997조건: 중고마지막 검증일:60일 이상 전
    SSM 5200

    SSM

    5200

    Metrology빈티지: 1997조건: 중고마지막 검증일:30일 이상 전
    SSM 5200

    SSM

    5200

    Metrology빈티지: 2008조건: 중고마지막 검증일:30일 이상 전