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OLYMPUS MX61L
  • OLYMPUS MX61L
설명
Metallographic Microscope Olympus MX61-L Ocular 10X BD 5X, 10X, 20X, 50X 12” * 12” stage
환경 설정
1. Eyepiece: SWN 10X/22 2. Observation tube: three-eye observation tube 3. Nose wheel: 5-hole electric nose wheel 4. Upper light source lamp house 5. Backlight module 6. Objective lens: BD 5X, 10X, 20X, 50X 7. CCD Adapter mirror 8. Mobile bed: 12"STAGE
OEM 모델 설명
The Olympus MX61L is a microscope designed for inspecting semiconductors with a 300mm frame. It offers high-quality imaging through various observation techniques, including brightfield, darkfield, differential interference contrast (DIC), fluorescence, infrared, and deep UV. This microscope is part of the Olympus Semiconductor & Flat Panel Display Inspection Solution and is an extended frame version of the MX61 microscope, capable of handling 300mm wafers and flat panels up to 24x24 inches.
문서

문서 없음

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검증됨

카테고리
Microscope

마지막 검증일: 60일 이상 전

주요 품목 세부 정보

조건:

Used


작동 상태:

알 수 없음


제품 ID:

74545


웨이퍼 사이즈:

알 수 없음


빈티지:

알 수 없음


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OLYMPUS

MX61L

verified-listing-icon
검증됨
카테고리
Microscope
마지막 검증일: 60일 이상 전
listing-photo-12d1fc1191784a71a8eedecc9b313523-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/5398/12d1fc1191784a71a8eedecc9b313523/d8f31ec4becc48caa253dfd87e3aa3f6_eb2999dd3ceb49cb835825df2967f75d1201a_mw.jpeg
주요 품목 세부 정보

조건:

Used


작동 상태:

알 수 없음


제품 ID:

74545


웨이퍼 사이즈:

알 수 없음


빈티지:

알 수 없음


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
Metallographic Microscope Olympus MX61-L Ocular 10X BD 5X, 10X, 20X, 50X 12” * 12” stage
환경 설정
1. Eyepiece: SWN 10X/22 2. Observation tube: three-eye observation tube 3. Nose wheel: 5-hole electric nose wheel 4. Upper light source lamp house 5. Backlight module 6. Objective lens: BD 5X, 10X, 20X, 50X 7. CCD Adapter mirror 8. Mobile bed: 12"STAGE
OEM 모델 설명
The Olympus MX61L is a microscope designed for inspecting semiconductors with a 300mm frame. It offers high-quality imaging through various observation techniques, including brightfield, darkfield, differential interference contrast (DIC), fluorescence, infrared, and deep UV. This microscope is part of the Olympus Semiconductor & Flat Panel Display Inspection Solution and is an extended frame version of the MX61 microscope, capable of handling 300mm wafers and flat panels up to 24x24 inches.
문서

문서 없음