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OLYMPUS MX61L
    설명
    Olympus MX61 metallographic microscope 1. Eyepiece: SWN 10X/222. Observation tube: Three-eye observation tube 3. Nose wheel: 5-hole electric nose wheel 4. Upper light source lamp house 5. Backlight module 6. Objective lens: BD 5X, 10X ,20X, 50X7. CCD adapter mirror 8. Mobile bed: 12"STAGE
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    OEM 모델 설명
    The Olympus MX61L is a microscope designed for inspecting semiconductors with a 300mm frame. It offers high-quality imaging through various observation techniques, including brightfield, darkfield, differential interference contrast (DIC), fluorescence, infrared, and deep UV. This microscope is part of the Olympus Semiconductor & Flat Panel Display Inspection Solution and is an extended frame version of the MX61 microscope, capable of handling 300mm wafers and flat panels up to 24x24 inches.
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    카테고리
    Microscope

    마지막 검증일: 60일 이상 전

    주요 품목 세부 정보

    조건:

    Used


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    제품 ID:

    108132


    웨이퍼 사이즈:

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    빈티지:

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    Logistics Support
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    Transaction Insured by Moov
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    Refurbishment Services
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    OLYMPUS

    MX61L

    verified-listing-icon
    검증됨
    카테고리
    Microscope
    마지막 검증일: 60일 이상 전
    listing-photo-d111fc038d30487bb805c46604c93b7e-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    108132


    웨이퍼 사이즈:

    알 수 없음


    빈티지:

    알 수 없음


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    설명
    Olympus MX61 metallographic microscope 1. Eyepiece: SWN 10X/222. Observation tube: Three-eye observation tube 3. Nose wheel: 5-hole electric nose wheel 4. Upper light source lamp house 5. Backlight module 6. Objective lens: BD 5X, 10X ,20X, 50X7. CCD adapter mirror 8. Mobile bed: 12"STAGE
    환경 설정
    환경 설정 없음
    OEM 모델 설명
    The Olympus MX61L is a microscope designed for inspecting semiconductors with a 300mm frame. It offers high-quality imaging through various observation techniques, including brightfield, darkfield, differential interference contrast (DIC), fluorescence, infrared, and deep UV. This microscope is part of the Olympus Semiconductor & Flat Panel Display Inspection Solution and is an extended frame version of the MX61 microscope, capable of handling 300mm wafers and flat panels up to 24x24 inches.
    문서

    문서 없음