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설명
Magnification 1.5 Nm at 15 kV/4 Nm at 1 kV, magnification 50 - 500,000 times, cathode (cold field emission), acceleration voltage 0.5 - 30 kV, manual sample adjustment in X, Y, Z directions, BSE detector Centaurus, EDX detector Bruker X-Flash 5030, incl. accessories, consisting of: 1 PC with Bruker Esprit 2.2 software for image processing, 1 24 inch monitor, 1 signal processing unit (Bruker) .1 BSE detector control, 2 high-voltage devices, 2 oil rotary pumps, 1 Van der Heijden heat exchanger and various sample holders, tiltable by 45°환경 설정
Scanning electron microscope with EDX detectorOEM 모델 설명
The S-4500 with a semi-in-lens type objective lens and cold field emission electron source suited to high resolution microscopy that was well received in the market.문서
문서 없음
유사 등재물
모두 보기
HITACHI
S-4500
카테고리
SEM / FIB
마지막 검증일: 14일 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
127176
웨이퍼 사이즈:
알 수 없음
빈티지:
1993
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설명
Magnification 1.5 Nm at 15 kV/4 Nm at 1 kV, magnification 50 - 500,000 times, cathode (cold field emission), acceleration voltage 0.5 - 30 kV, manual sample adjustment in X, Y, Z directions, BSE detector Centaurus, EDX detector Bruker X-Flash 5030, incl. accessories, consisting of: 1 PC with Bruker Esprit 2.2 software for image processing, 1 24 inch monitor, 1 signal processing unit (Bruker) .1 BSE detector control, 2 high-voltage devices, 2 oil rotary pumps, 1 Van der Heijden heat exchanger and various sample holders, tiltable by 45°환경 설정
Scanning electron microscope with EDX detectorOEM 모델 설명
The S-4500 with a semi-in-lens type objective lens and cold field emission electron source suited to high resolution microscopy that was well received in the market.문서
문서 없음