설명
Hitachi S-4500 , Scanning electron microscope with EDX detector Magnification 1.5 Nm at 15 kV/4 Nm at 1 kV, magnification 50–500,000x, cathode (cold field emission), accelerating voltage 0.5–30 kV, manual sample adjustment in X, Y, and Z axes, Centaurus BSE detector, Bruker X-Flash 5030 EDX detector, Including accessories, consisting of: 1 PC with Bruker Esprit 2.2 image processing software, 1 24-inch monitor, 1 signal processing unit (Bruker), 1 BSE detector controller, 2 high-voltage devices, 2 rotary oil pumps, 1 Van der Heijden heater exchanger, and various sample holders, tiltable by 45°환경 설정
환경 설정 없음OEM 모델 설명
The S-4500 with a semi-in-lens type objective lens and cold field emission electron source suited to high resolution microscopy that was well received in the market.문서
문서 없음
유사 등재물
모두 보기
HITACHI
S-4500
카테고리
SEM / FIB
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
114675
웨이퍼 사이즈:
알 수 없음
빈티지:
1995
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
Hitachi S-4500 , Scanning electron microscope with EDX detector Magnification 1.5 Nm at 15 kV/4 Nm at 1 kV, magnification 50–500,000x, cathode (cold field emission), accelerating voltage 0.5–30 kV, manual sample adjustment in X, Y, and Z axes, Centaurus BSE detector, Bruker X-Flash 5030 EDX detector, Including accessories, consisting of: 1 PC with Bruker Esprit 2.2 image processing software, 1 24-inch monitor, 1 signal processing unit (Bruker), 1 BSE detector controller, 2 high-voltage devices, 2 rotary oil pumps, 1 Van der Heijden heater exchanger, and various sample holders, tiltable by 45°환경 설정
환경 설정 없음OEM 모델 설명
The S-4500 with a semi-in-lens type objective lens and cold field emission electron source suited to high resolution microscopy that was well received in the market.문서
문서 없음