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HITACHI S-5500
  • HITACHI S-5500
설명
Hitachi S-5500 In-lens FE SEM In-lens Field Emission Scanning Electron Microscope.
환경 설정
Image Resolution : - 0.4nm guaranteed at accelerating voltage 30kV - 1.6nm guaranteed at accelerating voltage 1kV Magnification : - LM Mode 60X~100,0000X - HM Mode 800X~2,000,000X
OEM 모델 설명
The S-5500, Immersion Lens system which generates the highest resolution images in the world(*1)(0.4nm at 30kV. The S-5500 have improved performance over that of its predecessor, the S-5200. [Main features of S-5500] (1) The world’s highest resolution, 0.4 nm at 30 kV, achieved by the use of a new electron optics system (as of October 2004). (2) New BF (bright field)/ DF (dark field) Duo STEM (scanning transmission electron microscopy) detector allows simultaneous display of BF and DF STEM images. In DF STEM mode, this detector is capable of providing images with variable detection angles. This new detection system greatly extends the usage of low accelerating voltage STEM at 30 kV.
문서

문서 없음

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검증됨

카테고리
SEM / FIB

마지막 검증일: 60일 이상 전

주요 품목 세부 정보

조건:

Used


작동 상태:

알 수 없음


제품 ID:

65977


웨이퍼 사이즈:

알 수 없음


빈티지:

알 수 없음


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HITACHI

S-5500

verified-listing-icon
검증됨
카테고리
SEM / FIB
마지막 검증일: 60일 이상 전
listing-photo-ca96ef2ba5354a858cfd68e63b6d7eed-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/ca96ef2ba5354a858cfd68e63b6d7eed/d28b6187b5754800838c92c87d41fdf4_1_mw.png
주요 품목 세부 정보

조건:

Used


작동 상태:

알 수 없음


제품 ID:

65977


웨이퍼 사이즈:

알 수 없음


빈티지:

알 수 없음


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
Hitachi S-5500 In-lens FE SEM In-lens Field Emission Scanning Electron Microscope.
환경 설정
Image Resolution : - 0.4nm guaranteed at accelerating voltage 30kV - 1.6nm guaranteed at accelerating voltage 1kV Magnification : - LM Mode 60X~100,0000X - HM Mode 800X~2,000,000X
OEM 모델 설명
The S-5500, Immersion Lens system which generates the highest resolution images in the world(*1)(0.4nm at 30kV. The S-5500 have improved performance over that of its predecessor, the S-5200. [Main features of S-5500] (1) The world’s highest resolution, 0.4 nm at 30 kV, achieved by the use of a new electron optics system (as of October 2004). (2) New BF (bright field)/ DF (dark field) Duo STEM (scanning transmission electron microscopy) detector allows simultaneous display of BF and DF STEM images. In DF STEM mode, this detector is capable of providing images with variable detection angles. This new detection system greatly extends the usage of low accelerating voltage STEM at 30 kV.
문서

문서 없음